TEM systems continue FEI’s emphasis on technology leadership while redefining its product portfolio

FEI introduced three new systems that tailor the power oftransmission electron microscopy (TEM) to specific application and industryneeds. The new systems provide efficient and effective application-specificworkflows for semiconductor manufacturing and scientific research. They includethe new Metrios TEM for advanced semiconductor manufacturing metrology, TalosTEM that provides high-speed imaging and analysis for materials and life-scienceapplications and the Titan Themis TEM for enhanced atomic-scale measurements ofmaterial properties.